Electron Microscopy @ University of Nebraska
Main equipment: (1) JEOL JEM 2010 transmission electron microscope 200kV, analytical/high-resolution mode, LaB6 filament, single-tilting and double-tilting sample holders. (Oxford EDS system, Gatan dual-view CCD camera, TSL texture analysis system, Digi-TEM beam control system). (2) JEOL JSM 840A scanning electron microscope LaB6 filament, second electron and backscattered electron detectors, Kevex Quantum x-ray microanalyzer, Digital imaging system. (3) VG Microscopes HB501 STEM Field emission scanning transmission electron microscope, now including: Windowless x-ray microanalysis (Oxford/ 4pi), Digital image acquisition (4pi), Parallel-acquisi-tion ELLS, Energy-filtered electron diffraction, Differential phase contrast detector, Electron beam induced nanofabrication facility.
