Institute of Technology Characterization Facility @ University of Minnesota
The Characterization Facility ("CharFac") is a multi-user, shared instrumentation facility for materials research spanning from nanotechnology to biology and medicine. Our analytical capabilities include microscopy via electron beams, force probes and visible light; elemental and chemical imaging including depth profiling; elemental, chemical and mass spectroscopy; atomic and molecular structure analysis via X-ray, ion or electron scattering; nanomechanical and nanotribological probes; and other tools for surface and thin-film metrology.
CharFac resides administratively under the Institute of Technology (college of physical sciences, engineering and mathematics) with additional support from the Medical School. Well over 100 faculty research programs use our capabilities; these researchers originate from dozens of University of Minnesota departments under several colleges. We also work with some 60 industrial companies in a typical year, ranging from small start-ups to multinational corporations; these interactions include analytical service, training for independent use, and research collaboration. Finally, we are supported by the National Science Foundation as a key node in the National Nanotechnology Infrastructure Network to work with external academic institutions including research universities, 4-year colleges, technical colleges, and K-12 schools. IT Characterization Facility
Instrumentation:
Proximal Nanoprobe (AFM & related)
Scanning Probe Microscopy (SPM)
- SPM Overview
- Digital Instruments Nanoscope III Multimode
- Digital Instruments Nanoscope III plus Hysitron TriboScope
- Molecular Imaging PicoScan/PicoPlus
- Molecular Imaging PicoScan/PicoSPM
Scanning and Transmission Electron Microscopy Shepherd Labs Facility
- Environmental Scanning Electron Microscope (ESEM) - Philips ElectroScan (DOWN)
- Field Emission Gun-Scanning Electron Microscope (FEG-SEM) - JEOL 6500
- Field Emission Gun-Scanning Electron Microscope (FEG-SEM) - JEOL 6700
- Field Emission Gun Transmission Electron Microscope (FEG-TEM) - FEI Tecnai G2 30
- Transmission Electron Microscope (TEM) - FEI Tecnai T12
- Transmission Electron Microscope (TEM) - JEOL JEM-1210
Nils Hasselmo Hall Facility
- Cold Field Emission Gun Scanning Electron Microscope (FEG-SEM) - Hitachi S-4700
- Field Emission Gun Cryo Transmission Electron Microscope (Cryo FEG-TEM) - FEI Tecnai G2 F30
- Field Emission Gun Scanning Electron Microscope (FEG-SEM) - Hitachi S-900
- Transmission Electron Microscope (TEM) - JEOL 1200 EXII
Surface and Thin-Film Analysis
- Ion Beam Analysis
- Auger Electron Spectroscopy - Physical Electronics Model 545
- Spectroscopic Ellipsometer - VASE
- X-ray Photoelectron Spectroscopy (ESCA) - Physical Electronics Model 555
- X-ray Photoelectron Spectroscopy (ESCA) - Surface Science SSX-100
- Time-of-Flight Secondary Ion Mass Spectrometer (TOF-SIMS) - Physical Electronics Instruments TRIFT
Vibrational Spectroscopy
- Fourier Transform Infrared Spectrometer - Nicolet Magna-IR 750
- Confocal Raman Microscope
Visible Light Microscopy
- Phase-Measurement Interference Microscope - ZYGO Corp. Maxim 3D Model 5700
- Video and Computer-Enhanced Microscope - Nikon; Metamorph.
X-ray Diffraction &
Scattering
