Skip to Main Content
Login
Home
  • Overview
  • Centers
  • Research Groups
  • Facilities
  • Education
  • Program highlights
  • PREM
  • News
  • Events
  • Industry Outreach
  • Jobs
  • Contact

Spectroscopic ellipsometer @ Stanford/ IBM ARC/ UC Davis/ UC Berkeley

Used in fields
  • Thin Film Fabrication and Characterization

Facilities contact

Catherine Lee Hoffmann
hcl@stanford.edu
(650) 736-8903
http://cpima.stanford.edu/facilities

A Woollam spectroscopic ellipsometer is available at UC Davis for characterization of films and surfaces. This instrument is available for use by regular users.

Get Support from MRFN

mrfn.org

Materials Research Facilities Network

Types of equipment

  • Atom probe
  • Biomimetics
  • Ceramics
  • Coatings/Film Fabrication
  • Computing/Simulation
  • Confocal Fluorescence Microscopy
  • Crystal Growth
  • Crystallography
  • CVD
  • Electron Magnetic Resonance
  • Electron Microprobe
  • Electron Microscopy
  • Environmental Scanning Electron Microscopy
  • Focused Ion Beam
  • Image Analysis and Processing
  • Low Energy Electron Microscope
  • Low Temperature Lab
  • Magnetic Characterization
  • Materials Processing/Preparation
  • MBE
  • Mechanical Testing
  • Microfabrication / Microelectronics / Clean Room
  • Molecular IR Imaging
  • Near Field Scanning Microwave Microscope
  • NMR
  • Optical Microscopy
  • Polymer Processing
  • Polymer Synthesis/Characterization
  • Powder Synthesis and Characterization
  • Protein Expression
  • Pulsed Laser Deposition
  • Rutherford Backscattering
  • Scanning Probe Microscopy
  • Spectroscopy
  • Surface Preparation/Characterization
  • Synchrotron Beam Line
  • Thermal/Mechanical Analysis
  • Thin Film Fabrication and Characterization
  • UHV STEM
  • X-ray Diffraction

© Copyright 2009 Materials Research Science & Engineering Centers • All rights reserved. | Back to top

Powered by Drupal, an open source content management system