X-Ray Characterization

The X-Ray Characterization Facility is dedicated to materials identification and characterization through non-destructive, X-Ray Diffraction (XRD) and/or X-Ray Fluorescence (XRF) techniques.
Equipment
(1) Bruker-AXS D8 Discover High-Resolution Diffractometer
(2) Rigaku D-Max/B Horizontal Q/2Q X-Ray Diffractometer (with normal and small angle goniometer)
(3) Rigaku X-Ray Diffraction Laue Camera System (Transmission and Back Reflection)