CRISP – National Laboratory Collaborations: Advanced Photon Source & Brookhaven National Laboratory @ Yale University

Author(s):

D. Kumah, J. Reiner, Y. Segal, A. Kolpak, S. Ismail-Beigi, Z . Zhang, P. Zschack, D. Su, Y. Zhu, M. Sawicki, C. Broadbridge, F.J. Walker, C.H. Ahn (Yale University, Southern Connecticut State University, Argonne National Laboratory, Brookhaven National Laboratory)

A multi-partner collaborative effort has focused on understanding semiconductor-oxide interfaces.  This involves atomic layer precision in synthesis of the structures, correlating the structure and electronic properties using first principles, and obtaining subatomic resolution of structures from synchrotron x-ray diffraction a the Advanced Photon Source (Argonne National Laboratory) and electron micrsocopy (Brookhaven National Laboratory).  The outcomes of these studies are critical for the design of ferroelectric field effect transistors.