CRISP Variable Temperature, Variable Magnetic Field Ultrahigh Vacuum Scanning Force Microscope @ Yale University

Author(s):

P. A. Staffier, M. Liebmann, J. Falter, N. Pilet, C. H. Ahn, and U. D. Schwarz (Yale University)

Part of the CRISP Shared Equipment is a unique variable temperature, variable magnetic field ultrahigh vacuum scanning force microscope for applications in magnetic, electrostatic, piezoelectric, and friction force microscopy.

• One chamber vacuum system
• Entirely homebuilt, students played a key role in designing, building, and testing
• Enables investigations of local ferromagnetic and ferroelectric properties of complex oxide multiferroic material near their transition temperatures