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Recent Program Highlights

Cornell University researchers and collaborators have discovered – somewhat accidentally – a method for inserting a one-dimensional (1D) semiconductor channel into the “fabric” of a material that is only a few atoms thick.

On April 8, 2017, PCCM held its first Día de la Ciencia at the Princeton Public Library.

The Imaging and Analysis Center (IAC) supported by PCCM is a world-leading facility for materials characterization. It is a critical resource to our industrial user community.

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