Instrumentation: 300 keV HRTEM with FEG and GI Amray 1860 FEG high resolution SEM JEOL 6700F Scanning Electron Microscope JEOL 8600 Electron Microprobe Philips 420T TEM Zeiss SEM and Electron Beam Lithography System Facility URL: http://mrsec.jhu.edu/facilities/Electon%20Microscopy/Electron%20Microscopy%20Ind…MRFN Facility URL: https://mrfn.org/facilities/materials-research-science-engineering-center/electr…