Skip to content Skip to navigation

Imaging and Analysis Center

The Imaging and Analysis Center at Princeton University, directed by Dr. Nan Yao, implements high-end, state-of-the-art instrumentation for imaging and analysis to stimulate materials research and education at Princeton and in the surrounding region. The Center contains a suite of advanced electron microscopes; a dual-beam focused ion beam system; scanning probe microscopes; x-ray diffractmeters, image analysis and simulation facilities; and specimen preparation devices. For more information, including how to access the IAC and its instruments, please visit: