The Imaging and Analysis Center at Princeton University, directed by Dr. Nan Yao, implements high-end, state-of-the-art instrumentation for imaging and analysis to stimulate materials research and education at Princeton and in the surrounding region. The Center contains a suite of advanced electron microscopes; a dual-beam focused ion beam system; scanning probe microscopes; x-ray diffractmeters, image analysis and simulation facilities; and specimen preparation devices. For more information, including how to access the IAC and its instruments, please visit http://www.princeton.edu/~iac/.
Instrumentation: 
- Allied Multi Prep Polisher
 - AmScope Stereo Microscopes
 - Anton Paar MCR501 Rheometer
 - Anton Paar MCR502 Rheo-Confocal System
 - Anton Paar MCR702 Rheometer
 - Bruker D8 Advance XRD
 - Bruker D8 Discover X-Ray Diffractometer
 - Bruker Dimension ICON3 AFM
 - Bruker Multimode AFM
 - Bruker NanoMan AFM Dimension 3000 AFM
 - Computer Cluster
 - CreaTec LT-HV nc-AFM/STM
 - Cressington Carbon Coater
 - Diamond Knives
 - Differential Scanning Calorimeter 8500 (DSC)
 - Dimpler
 - Dynamic Mechanical Analysis 8000 (DMA)
 - Evactron Plasma Cleaner
 - FEI CM100 TEM
 - FEI CM200 FEG-TEM with EDS/EELS
 - FEI Helios G3 DualBeam FIB/SEM with EDS
 - FEI Quanta 200 FEG Environmental-SEM with EDS/EEL
 - FEI StrataTM DB 235 FIB
 - FEI Verios 460 XHR SEM with EDS
 - FEI Vitrobot Units
 - FEI XL30 FEG-SEM
 - Fischione 1010 dual-beam Ion Mill
 - Fischione NanoClean Station
 - FLS980 Steady State, Phosphorescence/Flourescence Lifetime Spectrometer
 - Glass Knife Maker
 - Horiba Raman Spectrometer
 - Isitemp Oven
 - Keithley 4200-SCS Semiconductor Characterization System
 - Keyence VK-X1000 Confocal Microscope
 - Leica Confocal DCM 3D
 - Leica Sputter Coater
 - Leica Ultracut UCT Ultramicrotome Instrument
 - Low-speed Diamond Saw
 - Nicolet iN10 MX FTIR
 - Optical Microscope w/CCD Camera
 - Plasma Cleaner
 - Reichert-Jung Ultracut E Microtome
 - Rigaku MiniFlex XRD
 - Spectrometer (TGA-GC/MS)
 - Talos F200X S/TEM with SuperX-EDS
 - TEM sample cutter
 - Thermo K-alpha X-ray Photoelectron Spectrometer (XPS/UPS)
 - Thermogravimetric Analyzer coupled to Clarus 680 SQ 8T Gas Chromatograph Mass
 - Tital Themis 80-300 Cubed Double Cs-corrected S/TEM with EDS
 - Titan Krios G3 300 cryo-TEM
 - Ultrasonic Cutter
 - UV-VIS Cary 5000 Spectrometer
 - VCR IBS/TM 200S Ion Bean Sputterer
 - Woollam M-2000 Ellipsometer
 - Zeiss Axios Scope A1 Transmission, Reflection, Polarizing Microscope
 - Zeiss Discovery V12 Stereomicroscope
 - Zeiss Xradias Versa 520 3D X-ray microscope
 
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