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UD Keck Center for Advanced Microscopy and Microanalysis

The W. M. Keck Center for Advanced Microscopy and Microanalysis (Keck CAMM) houses two 200 kV field emission transmission electron microscopes (Talos F200C and JEM-2010F), one 300 kV transmission electron microscope (JEM-3010), one 120 kV transmission electron microscope (Tecnai-12), two field emission scanning electron microscopes with FIB-SEM dual beam capability (Auriga 60 and JSM-7400F), and two scanning probe microscopes (Dimension 3100V and Multimode NanoScope V).

See Facility Type below. Additional Facility Types:

In-Situ TEM

Cryo-TEM

Cryo-SEM

 

Facility Primary Contact: Chaoying Ni