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CRISP High resolution non-contact Atomic Force Microscope (AFM)

Understanding the locations of atoms as they are deposited on a surface is critical for growing interfaces of electronicÂ’  device quality. One unique tool that is key to this endeavor, is the high-resolution, low-temperature ultrahigh vacuum scanning probe microscope for simultaneous operation in noncontact atomic force microscopy and scanning tunneling microscopy mode at 4 K available at CRISP (Yale).

Download High resolution non-contact AFM Highlight