The X-Ray Diffraction SEF contains an diverse suite of diffractometers to analyze polycrystalline, single crystal, thin film, polymer, and nanostructured samples. A wide variety of software is also available in the data analysis lab. For more information on how to access the X-ray Diffraction SEF and detailed descriptions the instrumentation please visit our website at http://prism.mit.edu/xray/index.html.
Instrumentation:
- BACK REFLECTION LAUE DIFFRACTOMETER
- Bede Triple Axis Diffractometer
- BRUKER D8 GADDS MULTIPURPOSE DIFFRACTOMETER
- BRUKER D8 HIGH RESOLUTION DIFFRACTOMETER
- Bruker D8 Multipurpose Diffractometer
- Bruker Single Crystal Diffractometer
- Bruker Small Angle Diffractometer
- BRUKER TRACER-III SD PORTABLE XRF UNIT
- Horiba Jobin Yvon, ICP-AES
- PANalytical Multipurpose Diffractometer
- PANALYTICAL MULTIPURPOSE DIFFRACTOMETER
- Quantum Design Inc. Magnetic Property Measurement Systems (MPMS-5S)
- Quantum Design Inc. Magnetic Property Measurement Systems (MPMS-XL)
- Quantum Design Magnetic Property Measurement System (MPMS VSM)
- RIGAKU H3R SOURCE/BRUKER NANOSTAR SAXS SYSTEM
- Rigaku Powder Diffractometers
- RIGAKU RU-300 POWDER DIFFRACTOMETER
- RIGAKU SMARTLAB MULTIPURPOSE DIFFRACTOMETER
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