The central NIAC facility has provided materials researchers and industrial clients with electron microscopy imaging and analytical analysis, surface analysis and x-ray diffraction serves for over 25 years. The NIAC houses:
 
- Dynacool PPMS System
 - J.A. Woollam Variable Angle Spectroscopic Ellipsometer (VASE) and Infrared VASE (IR-VASE) systems
 - Cameca Local Electrode Atom Probe
 - Three scanning electron microscopes with Electron Dispersive X-ray spectrometers
 - Four transmission electron microscopes, with Cryo TEM tomography and an FEI Titan aberration corrected (S)TEM
 - A surface analysis instrument: a Thermo Fisher k-alpha X-Ray Photoelectron Spectrometer
 - Three atomic force microscopes including a Bruker Icon and a Bruker Catalyst BioAFM
 - Two dual-beam focused ion beam instruments, including a Plasma Focused Ion Beam
 - An Andor Spinning Disk Confocal Microscope
 - A confocal micro-Raman spectrometer (Horiba LabRAM HR Evolution)
 - A small-angle x-ray diffractometer (SAXS)
 - Three additional Diffractometers
 - A ZYGO Optical Interferometer
 - A Horiba Nanolog spectrofluorometer
 - A UV/VIS Dual Beam Fluorometer
 
For use, questions or more information, please contact the DIrector of MRSEC facilities:
Dr. Jerry Hunter
(608) 263-1073
Instrumentation: 
- Bruker D8 Discover Diffractometer X-Ray Diffractometer (XRD)
 - Bruker Icon AFM
 - Bruker Multimode 8 Atomic Force Microscope (AFM, SPM)
 - Cameca IMS-4fE7 Secondary Ion Mass Spectrometer
 - Dynacool PPMS
 - FEI Titan Aberration-corrected (S)TEM
 - Horiba LabRAM HR Evolution Raman Spectrometer
 - Hysitron TI950 Triboindenter
 - Leica EM TiC 3X Ion Beam Milling System
 - Malvern PANalytical X'Pert PRO X-Ray Diffractometer (XRD)
 - Micro FT-IR Spectrometer
 - NanoMill
 - PANalytical Empyrean X-ray diffractometer
 - Tecnai TF-30 300KV Field Emission Scanning Transmission Electron Microscope (FE STEM)
 - ThermoFisher Helios G4 UX Plasma Focused Ion Beam/Field Emission Scanning Electron Microscope
 - Wisconsin MRSEC X-ray Endstation for Nanoscale Transformations (MXNT)
 - X-ray Photoelectron Spectrometer (XPS)
 - Zeiss Auriga Focused Ion Beam FIB/FESEM
 - Zeiss Gemini 300 FESEM
 - Zeiss Gemini 450 FESEM
 - Zeiss Leo 1530 FESEM/EDS/EBSD
 - ZYGO 9000 Optical Profilometer