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Single-Defect Phonons Imaged by Electron Microscopy

The new Nion HERMES 200 is an aberration corrected, monochromated scanning transmission electron microscope (STEM) equipped with angle-resolved electron energy-loss spectroscopy (EELS), which is the first at a University Shared Facility.

Based on the new capabilities of this instrument, the UCI MRSEC team (Pan and Wu) demonstrated, for the first time, exotic atomic vibrations localized at a single stacking fault in cubic SiC, showing by an energy shift of 3.8 meV and an obvious intensity modulation of the acoustic phonon mode.