Atomic Resolution Imaging at 2.5 GHz using Near Field Microwave Microscopy

May 10, 2011

MRSEC center: 
University of Maryland
Author(s) with affiliations: 
<p>Ichiro Takeuchi,&nbsp; University of Maryland MRSEC, DMR 0520471</p>

Sub-nanometer probes of surfaces provide important information about chemical and physical properties of materials at atomic level.  Microwave microscopy (left) is used to study materials properties at GHz (109 sec-1). This is the frequency range relevant for computers and cell phones, for which the materials are being explored. We show for the first time that one can image atoms at this frequency (right).

Schematic of microwave microscope
Fig. 1: Schematic of microwave microscope

Atomically images of Au(111) surface resolved in microwave signal
Fig. 2: Atomic resolution images of Au(111) surface resolved in microwave signal

J. Lee, C. J. Long, H. Yang, X.-D. Xiang and I. Takeuchi, "Atomic resolution imaging at 2.5 GHz using near-field microwave Microscopy." Applied Physics Letters 97, 183111/1-3 (2010). doi: 10.1063/1.3514243
http://link.aip.org/link/doi/10.1063/1.3514243
IRG Group Number: 
IRG II
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